2011-2012 University Catalog 
  
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2011-2012 University Catalog

ECE 745 - ULSI Microelectronics

Credits: 3 (NR)
Studies UltraLargeScaleIntegration (more than a million devices in a single chip) by considering limits of packing density, modeling of devices, and circuit topology. Semiconductor material and device physics imposed “second order effects” and limitations on deep submicron CMOS performance. Reliability studied through analytical (compact) modeling and numerical simulations. Presents and evaluates new ULSI technologies such as SOI CMOS.

Prerequisite(s): ECE 684.

Hours of Lecture or Seminar per week: 3
Hours of Lab or Studio per week: 0